Course: Nanometrology

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Course title Nanometrology
Course code KEF/BNMT
Organizational form of instruction Lecture
Level of course Master
Year of study not specified
Semester Winter
Number of ECTS credits 3
Language of instruction Czech
Status of course Optional
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
  • Vůjtek Milan, Mgr. Ph.D.
Course content
- Metrology, standardization, uncertainty, metrological traceability - Length nanometrology - problems connected with tiny sizes, metrological AFM, standards, evaluation, surface description - Nanometrology of angle, mass, force and other quantities - Quantum etalons of basic physical quantities

Learning activities and teaching methods
Monologic Lecture(Interpretation, Training)
  • Attendace - 25 hours per semester
  • Preparation for the Exam - 20 hours per semester
  • Homework for Teaching - 30 hours per semester
Learning outcomes
Students obtain basic information about general metrology and standardization and deeper insight into metrology of nanostructures, especially in the field of length nanometrology.
Knowledge Define the main ideas and conceptions of the subject, describe the main approaches of the studied topics, recall the theoretical knowledge for solution of model problems.

Assessment methods and criteria

" Oral exam
Recommended literature
  • Leach R. (2010). Fundamental Principles of Engineering Nanometrology.. Elsevier.
  • Mlčoch J., Rössler T. (2005). Teorie měření a experimentu. Vydavatelství UP, Olomouc.
  • Whitehouse D. J. (2003). Handbook of Surface and Nanometrology.. IOP.

Study plans that include the course
Faculty Study plan (Version) Branch of study Category Recommended year of study Recommended semester
Faculty of Science Nanotechnology (1) Special and interdisciplinary fields 2 Winter