Course: Microscopy and X-ray Structural Analysis

« Back
Course title Microscopy and X-ray Structural Analysis
Course code KEF/MKRSA
Organizational form of instruction Lecture
Level of course Bachelor
Year of study not specified
Semester Winter
Number of ECTS credits 4
Language of instruction Czech
Status of course Compulsory-optional
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
Lecturer(s)
  • Kubínek Roman, doc. RNDr. CSc.
Course content
- Light microscopy - theory of visual display in the light microscope, magnification, resolution efficiency, constructive parts of the light microscope, displaying methods (bright and dark field, phase contrast, Nomarski differential interference contrast, Hoffman modulation contrast, UV and IR spectroscopy, fluorescent microscopy), preparation of samples for the light microscope, confocal laser scanning and tandem microscopy, near-field microscopy. PALM, STORM, ..superresolution - Electron microcopy - principles of electron microscopy, interaction of electrons with a solid, basics of electron optics, resolution efficiency and depth of sharpness of the electron microscope, TEM, SEM, working regimes of the electron microscope, environmental electron microscope, preparation of samples for the electron microscope, fixation, dehydration, drying and sputtering, ultramicrotomy, methods of frozen etching and rapture, analytical electron microscopy (WDS, EDS). - Scanning probe microscopy - overview of methods of scanning probe microscopy, scanning tunneling microscopy, atomic force microscopy (AFM), LFM, MFM - X-ray structural analysis - theory of structure of crystalline materials, transformation of symmetry, lattice, elementary cells, Miller indices, elements and operations of symmetry, Bravais elementary cells, outward shape of a crystal and defects in crystals, Quasicrystals and amorphous materials, theory of percolation, physics of X-rays, theory of diffraction (Bragg equation, reciprocal lattice, Laue conditions, intensity of diffraction maxima), experimental methods of X-ray structural analysis, sources and detectors of X-rays, Debye-Scherrer method, textures, Laue method, method of crystal rotation, precession Weissenberg method, scattering at small angles.

Learning activities and teaching methods
Lecture
  • Attendace - 40 hours per semester
  • Homework for Teaching - 20 hours per semester
  • Preparation for the Exam - 50 hours per semester
Learning outcomes
Microscopy and preparation of samples . Theory of structure of crystalline materials, experimental methods of X-ray structural analysis.
Knowledge Define the main ideas and conceptions of the subject, describe the main approaches of the studied topics, recall the theoretical knowledge for solution of experimental methods.
Prerequisites
The basics cource of physics

Assessment methods and criteria
Didactic Test

80% knowledge of basis theory and experimental methods
Recommended literature
  • Douglas B. Murphy. (2001). Fundamentals of Ligt Microscopy and Electronic Imagin. Wiley-Liss.
  • Kubínek, R., Mašláň, M., Vůjtek, M. (2002). Mikroskopie skenující sondou. UP Olomouc.
  • L.Reimer. (1988). Scanning Electron Microscopy - Physics of Image Formation and Microanalysis. Springer.
  • Nauš, J. (1985). Experimentální metody biofyziky I. Učební text UP Olomouc.
  • Plášek, J. (1996). Nové metody optické spektroskopie. Pokroky mat. fyz. astron. 41, 1-24.
  • Prosser, V. a kol. (1989). Experimentální metody biofyziky. Academia Praha.
  • V. Valvoda, M. Polcarová a P. Lukáč. (1992). Základy strukturní analýzy. Univerzita Karlova, Praha.
  • Vůjtek, M., Kubínek, R., & Mašláň, M. (2012). Nanoskopie. V Olomouci: Univerzita Palackého.


Study plans that include the course
Faculty Study plan (Version) Branch of study Category Recommended year of study Recommended semester
Faculty of Science Applied Physics (2015) Physics courses 1 Winter