Course: Nanometrology

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Course title Nanometrology
Course code KEF/NMT
Organizational form of instruction Lecture
Level of course Master
Year of study not specified
Semester Winter
Number of ECTS credits 3
Language of instruction Czech
Status of course Compulsory-optional
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
Lecturer(s)
  • Vůjtek Milan, Mgr. Ph.D.
Course content
Metrology, standardization, uncertainty, metrological traceability Length nanometrology - problems connected with tiny sizes, metrological AFM, standards, evaluation, surface description Nanometrology of angle, mass, force and other quantities Quantum etalons of basic physical quantities

Learning activities and teaching methods
Lecture
  • Preparation for the Exam - 50 hours per semester
  • Homework for Teaching - 15 hours per semester
  • Attendace - 24 hours per semester
Learning outcomes
Students obtain basic information about general metrology and standardization and deeper insight into metrology of nanostructures, especially in the field of length nanometrology.
Describe usage of metrological principles in nanotechnology
Prerequisites
unspecified

Assessment methods and criteria
Mark

Knowledge in extent of course
Recommended literature
  • Leach R. (2010). Fundamental Principles of Engineering Nanometrology.. Elsevier.
  • Mlčoch J., Rössler T. (2005). Teorie měření a experimentu. Vydavatelství UP, Olomouc.
  • Whitehouse D. J. (2003). Handbook of Surface and Nanometrology.. IOP.


Study plans that include the course
Faculty Study plan (Version) Branch of study Category Recommended year of study Recommended semester
Faculty of Science Applied Physics (2015) Physics courses 2 Winter