Course: Theory and Practice of Electron Microscopy

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Course title Theory and Practice of Electron Microscopy
Course code KEF/PGSEM
Organizational form of instruction Lecture
Level of course Doctoral
Year of study not specified
Semester Winter and summer
Number of ECTS credits 20
Language of instruction Czech, English
Status of course unspecified
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
  • Kubínek Roman, doc. RNDr. CSc.
Course content
Electron as a wave in vacuum Visualization of an image created by electrons Tube of transmission electron microscope (TEM) Electron gun and lenses of TEM, vacuum system of TEM Basic working regimes of TEM TEM with high resolution Scanning electron microscope (SEM) and interaction of electrons with materials Generation of an image and types of contrast in SEM Function and constructive elements of SEM, parameters of imaging of SEM, sharpness depth and resolution power of SEM, modification of an image in SEM Preparation of samples for TEM Preparation of samples for REM Environmental REM, WDS and EDS (spectrometers with dispersion according to the wavelength and energy) Energy of spectral lines of selected elements

Learning activities and teaching methods
  • Attendace - 36 hours per semester
Learning outcomes
Electron microscops - principle of operration.
Subject is based on knowledge and application of electron microscopy methods. Evaluate the particular methods and principles, explain the aspects and results concerning the given issue, integrate the knowledge, predict the solutions, evaluate the results and outcomes.

Assessment methods and criteria
Mark, Systematic Observation of Student, Seminar Work

Theoretical and practical knowledges within the scope of the course topics (examination)
Recommended literature
  • Web page: - elektronová mikroskopie.
  • John C. H. Spence. (2003). High-Resolution Electron Microscopy (Monographs on the Physics and Chemistry of Materials). Oxford Uniniversity Press.
  • Joseph Goldstein, Dale E. Newbury, David C. Joy, and Charles E. Lyman. (2003). Scanning Electron Microscopy and X-ray Microanalysis. Springer Science.
  • M. A. Hayat and M.A. Hayat. (2000). Principles and Techniques of Electron Microscopy: Biological Applications. Cambridge University Press.
  • Ray F. Egerton. (2005). Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer Science.
  • Vůjtek, M., Kubínek, R., & Mašláň, M. (2012). Nanoskopie. V Olomouci: Univerzita Palackého.

Study plans that include the course
Faculty Study plan (Version) Branch of study Category Recommended year of study Recommended semester