Course: Scanning Probe Microscopy and its Applications

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Course title Scanning Probe Microscopy and its Applications
Course code KEF/PGSSO
Organizational form of instruction Lecture
Level of course Doctoral
Year of study not specified
Semester Winter and summer
Number of ECTS credits 20
Language of instruction Czech, English
Status of course unspecified
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
Lecturer(s)
  • Kubínek Roman, doc. RNDr. CSc.
Course content
Scanning tunneling microscopy (STM) Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes MFM - Magnetic force microscopy LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques SPM as a surface analytical tool Environment of SPM methods Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips The artifacts of the images Tip convolution effect Feedback artifacts Possibilities of computer image analysis, testing of artifacts Applications of SPM

Learning activities and teaching methods
Lecture
  • Attendace - 36 hours per semester
Learning outcomes
Scanning tunneling microscopy (STM), AFM,l MFM, LFM, SPM, aplications. <li> Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes <li> MFM - Magnetic force microscopy <li> LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques <li> SPM as a surface analytical tool <li> Environment of SPM methods <li> Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips <li> The artifacts of the images <li> Tip convolution effect <li> Feedback artifacts <li> Possibilities of computer image analysis, testing of artifacts <li> Applications of SPM </ul>
The cource is based on abilities to theoretical and practical use of experimental methods. Evaluate the particular methods and principles, explain the aspects and results concerning the given issue, integrate the knowledge, predict the solutions, evaluate the results and outcomes.
Prerequisites
Experimental Physics lectures

Assessment methods and criteria
Mark, Seminar Work

Knowledge within the scope of the course topics (examination)
Recommended literature
  • http://atmilab.upol.cz/brozura.html - e-verze učebního textu.
  • Bonnel, D. (2001). Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications. Wiley.
  • Kubínek, R.-Mašláň, M.-Vůjtek, M. (2003). Mikroskopie skenující sondou. UP Olomouc.
  • Meyer E., Hug H. J., Bennewitz R. (2004). Scanning Probe Microscopy: The Lab on a Tip by.. Springer Verlag, Berlin, Heidelberg, New York.
  • Vůjtek, M., Kubínek, R., & Mašláň, M. (2012). Nanoskopie. V Olomouci: Univerzita Palackého.


Study plans that include the course
Faculty Study plan (Version) Branch of study Category Recommended year of study Recommended semester